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Mostrati risultati da 1 a 16 di 16
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Particle filtering of hidden Gamma processes for robust Predictive Maintenance in semiconductor manufacturing 1-gen-2010 Schirru, Andrea; Pampuri, Simone; DE NICOLAO, Giuseppe
Multilevel statistical process control of asynchronous multi-stream processes in semiconductor manufacturing 1-gen-2010 Schirru, Andrea; Pampuri, Simone; DE NICOLAO, Giuseppe
Proportional Hazard Model with L1 Penalization applied to Predictive Maintenance in Semiconductor Manufacturing 1-gen-2011 Pampuri, Simone; Schirru, Andrea; C., De Luca; DE NICOLAO, Giuseppe
Proportional Hazard Model with L1 Penalization applied to Predictive Maintenance in Semiconductor Manufacturing 1-gen-2011 Pampuri, Simone; Schirru, Andrea; C., De Luca; DE NICOLAO, Giuseppe
Multilevel Lasso Applied to Virtual Metrology in Semiconductor Manufacturing 1-gen-2011 Pampuri, Simone; Schirru, Andrea; G., Fazio; DE NICOLAO, Giuseppe
Multilevel Lasso Applied to Virtual Metrology in Semiconductor Manufacturing 1-gen-2011 Pampuri, Simone; Schirru, Andrea; G., Fazio; DE NICOLAO, Giuseppe
Multilevel kernel methods for virtual metrology in semiconductor manufacturing 1-gen-2011 Schirru, Andrea; Pampuri, Simone; De Luca, Cristina; DE NICOLAO, Giuseppe
Proportional Hazard Model with L1 Penalization applied to Predictive Maintenance in Semiconductor Manufacturing 1-gen-2011 Pampuri, Simone; Schirru, Andrea; De Luca, Cristina; DE NICOLAO, Giuseppe
Multilevel Lasso Applied to Virtual Metrology in Semiconductor Manufacturing 1-gen-2011 Pampuri, Simone; Schirru, Andrea; Fazio, Giuseppe; DE NICOLAO, Giuseppe
Nonparametric Virtual Sensors for Semiconductor Manufacturing". 1-gen-2011 Schirru, Andrea; Pampuri, Simone; De Luca, Cristina; DE NICOLAO, Giuseppe
Multistep virtual metrology approaches for semiconductor manufacturing processes 1-gen-2012 Pampuri, Simone; Schirru, Andrea; G., Susto; C. D., Luca; A., Beghi; DE NICOLAO, Giuseppe
An information-theory and Virtual Metrology-based approach to Run-to-Run semiconductor manufacturing control 1-gen-2012 G., Susto; Schirru, Andrea; Pampuri, Simone; DE NICOLAO, Giuseppe; A., Beghi
Virtual sensors for semiconductor manufacturing: A nonparametric approach - Exploiting information theoretic learning and Kernel machines 1-gen-2013 Schirru, Andrea; Pampuri, Simone; C., De Luca; DE NICOLAO, Giuseppe
Multi-step virtual metrology for semiconductor manufacturing: A multilevel and regularization methods-based approach 1-gen-2015 Susto, G.; Pampuri, Simone; Schirru, Andrea; Beghi, A.; DE NICOLAO, Giuseppe
A hidden-Gamma model-based filtering and prediction approach for monotonic health factors in manufacturing 1-gen-2018 Susto G., A; Schirru, Andrea; Pampuri, Simone; S., and Beghi; Nicolao, De
Multicenter Study on Sleep and Circadian Alterations as Objective Markers of Mild Cognitive Impairment and Alzheimer's Disease Reveals Sex Differences 1-gen-2020 Guarnieri, B.; Maestri, M.; Cucchiara, F.; Lo Gerfo, A.; Schirru, A.; Arnaldi, D.; Mattioli, P.; Nobili, F.; Lombardi, G.; Cerroni, G.; Bartoli, A.; Manni, R.; Sinforiani, E.; Terzaghi, M.; Arena, M. G.; Silvestri, R.; La Morgia, C.; DI Perri, M. C.; Franzoni, F.; Tognoni, G.; Mancuso, M.; Sorbi, S.; Bonuccelli, U.; Siciliano, G.; Faraguna, U.; Bonanni, E.
Mostrati risultati da 1 a 16 di 16
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