This paper gives a quantitative analysis of the main mechanisms setting fundamental limits to the linearity performances of CMOS direct down-conversion mixers. An advanced low voltage solution is proposed for 3G cell-phones in a 90 nm CMOS technology that achieves: 3nV/radicHz average input referred noise in the band from 10 kHz to 1.92 MHz, a flicker noise corner of 300 kHz, 9 dBm IIP3 and 75 dBm minimum IIP2 while drawing 5.4 mA from a 1.2 V supply.

High Linearity Down-Conversion CMOS Mixers

MANSTRETTA, DANILO
2008-01-01

Abstract

This paper gives a quantitative analysis of the main mechanisms setting fundamental limits to the linearity performances of CMOS direct down-conversion mixers. An advanced low voltage solution is proposed for 3G cell-phones in a 90 nm CMOS technology that achieves: 3nV/radicHz average input referred noise in the band from 10 kHz to 1.92 MHz, a flicker noise corner of 300 kHz, 9 dBm IIP3 and 75 dBm minimum IIP2 while drawing 5.4 mA from a 1.2 V supply.
2008
EuMIC 2008. European Microwave Integrated Circuit Conference, 2008.
9782874870071
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11571/140268
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 3
  • ???jsp.display-item.citation.isi??? 2
social impact