COVI, ERIKA
 Distribuzione geografica
Continente #
NA - Nord America 301
AS - Asia 238
EU - Europa 186
SA - Sud America 19
AF - Africa 2
Totale 746
Nazione #
US - Stati Uniti d'America 299
CN - Cina 152
IE - Irlanda 64
SG - Singapore 50
DE - Germania 28
RU - Federazione Russa 25
FI - Finlandia 23
HK - Hong Kong 20
BR - Brasile 16
UA - Ucraina 15
SE - Svezia 11
BE - Belgio 6
GB - Regno Unito 6
IT - Italia 4
VN - Vietnam 4
BD - Bangladesh 3
IN - India 2
NL - Olanda 2
AZ - Azerbaigian 1
CA - Canada 1
CL - Cile 1
EC - Ecuador 1
IL - Israele 1
IQ - Iraq 1
JP - Giappone 1
KH - Cambogia 1
LV - Lettonia 1
MX - Messico 1
PE - Perù 1
PH - Filippine 1
RO - Romania 1
TJ - Tagikistan 1
TN - Tunisia 1
ZA - Sudafrica 1
Totale 746
Città #
Dublin 62
Chandler 56
Jacksonville 38
Beijing 36
Singapore 28
Ann Arbor 27
Hong Kong 20
Nanjing 20
Ashburn 17
Nanchang 15
Hebei 13
Munich 13
Boardman 11
Changsha 11
Lawrence 9
Los Angeles 9
Medford 9
Princeton 9
Shenyang 9
Jiaxing 8
Tianjin 8
Wilmington 8
Brussels 6
Dallas 6
Shanghai 6
Hangzhou 5
Buffalo 4
New York 4
Woodbridge 4
Helsinki 3
Ho Chi Minh City 3
Moscow 3
Redondo Beach 3
Turku 3
Bento Gonçalves 2
Dhaka 2
Fairfield 2
Guangzhou 2
Norwalk 2
Nuremberg 2
Orange 2
Washington 2
Aparecida de Goiânia 1
Baku 1
Basra 1
Bologna 1
Buffalo Grove 1
Campinas 1
Caraguatatuba 1
Castro 1
Chennai 1
Criciúma 1
Denver 1
Des Moines 1
Dushanbe 1
El Carmen 1
Greenwich 1
Haifa 1
Itaquaquecetuba 1
Johannesburg 1
Liaocheng 1
Lima region 1
Lithonia 1
Manila 1
Menlo Park 1
Mexico City 1
Milan 1
Montreal 1
Naaldwijk 1
Natal 1
Pavia 1
Pelotas 1
Petrolina 1
Philadelphia 1
Phnom Penh 1
Phoenix 1
Raipur 1
Redwood City 1
Riga 1
Rio de Janeiro 1
Salvador 1
San Francisco 1
San Jose 1
Santa Clara 1
Santiago Metropolitan 1
Stockholm 1
São Paulo 1
Taizhou 1
The Dalles 1
Tokyo 1
Tomsk 1
Tunis 1
Uberlândia 1
Votorantim 1
Yangzhou 1
Zhengzhou 1
Totale 556
Nome #
On-wafer analog pulse generator for fast characterization and parametric test of resistive switching memories 107
On-wafer integrated system for fast characterization and parametric test of new-generation Non Volatile Memories 106
A circuit for linearly decreasing temperature SET programming of PCM based on Ge-rich GST 94
High-swing buffer for programmable resistive memories 89
Temperature study of high-drive capability buffer for Phase Change Memories 84
Compact model for phase change memory cells 83
Optimal programming with voltage-controlled temperature profile to reduce SET state distribution dispersion in PCM 81
Automatic trimming procedure to enhance the accuracy of on-chip analog pulse generators 72
High-drive capability buffer for highly variable resistive loads 70
Totale 786
Categoria #
all - tutte 3.473
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 3.473


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/202136 0 0 0 0 0 4 2 12 1 10 5 2
2021/202244 0 2 1 1 0 5 1 2 2 0 9 21
2022/2023164 14 18 1 9 15 18 0 5 75 2 5 2
2023/202438 4 6 1 2 7 8 0 0 0 5 1 4
2024/2025138 0 9 3 13 11 3 3 5 35 2 15 39
2025/2026119 26 10 22 26 32 3 0 0 0 0 0 0
Totale 786