TORILLA, GIANMARCO
TORILLA, GIANMARCO
DIPARTIMENTO DI INGEGNERIA INDUSTRIALE E DELL'INFORMAZIONE
A test platform for CMOS SPADs and digital SiPMs in a 110 nm technology
2024-07-10 Torilla, Gianmarco
A Wireless, Battery-Powered Probe Based on a Dual-Tier CMOS SPAD Array for Charged Particle Sensing
2023-01-01 Minga, J; Brogi, P; Collazuol, G; Dalla Betta, Gf; Marrocchesi, Ps; Morsani, F; Pancheri, L; Ratti, L; Torilla, G; Vacchi, C
APiX, a two-tier avalanche pixel sensor for digital charged particle detection
2019-01-01 Brogi, P.; Bigongiari, G.; Checchia, C.; Collazuol, G.; Dalla Betta, G. F.; Ficorella, A.; Marrocchesi, P. S.; Morsani, F.; Musacci, M.; Torilla, G.; Pancheri, L.; Ratti, L.; Savoy-Navarro, A.; Silvestrin, L.; Stolzi, F.; Suh, J. E.; Sulaj, A.; Vacchi, C.; Zarghami, M.
Bulk Damage Effects in Neutron Irradiated Single- and Dual-Layer 150-nm CMOS SPADs
2025-01-01 Shojaei, F.; Brogi, P.; Dalla Betta, G. -F.; Giroletti, S.; Marrocchesi, P. S.; Minga, J.; Pancheri, L.; Ratti, L.; Torilla, G.; Vacchi, C.
Characterization of a Fast Neutron Irradiation Facility Using a Stilbene Scintillation Detector
2024-01-01 Pino, F.; Delgado, J. C.; Polo, M.; Fanchini, E.; Selva, A.; Minga, J.; Torilla, G.; Ratti, L.; Moretto, S.
Cross-talk and RTS Noise Characterization of 1- and 2-tier CMOS SPADs in a 150 nm Process
2021-01-01 Ratti, Lodovico; Brogi, P.; Collazuol, G.; Betta, G. -F. Dalla; Marrocchesi, P. S.; Minga, J.; Morsani, F.; Pancheri, L.; Torilla, G.; Vacchi, C.
DCR and crosstalk characterization of a bi-layered 24 × 72 CMOS SPAD array for charged particle detection
2023-01-01 Torilla, G.; Minga, J.; Brogi, P.; Collazuol, G.; Dalla Betta, G. -F.; Marrocchesi, P. S.; Pancheri, L.; Ratti, L.; Vacchi, C.
DCR Performance in Neutron-Irradiated CMOS SPADs from 150- To 180-nm Technologies
2020-01-01 Ratti, L.; Brogi, P.; Collazuol, G.; Betta, G. -F. D.; Ficorella, A.; Marrocchesi, P. S.; Morsani, F.; Pancheri, L.; Torilla, G.; Vacchi, C.
Experimental results of the pFREYA16 ASIC for x-ray ptychography in continuous wave light sources
2024-01-01 Lazzaroni, P.; Hammer, M.; Manghisoni, M.; Miceli, A.; Ratti, L.; Re, V.; Shi, H.; Torilla, G.
Layered CMOS SPADs for Low Noise Detection of Charged Particles
2021-01-01 Ratti, L.; Brogi, P.; Collazuol, G.; Dalla Betta, G. -F.; Marrocchesi, P. S.; Pancheri, L.; Sulay, A.; Torilla, G.; Vacchi, C.
Online Dark Count Rate Measurements in 150 nm CMOS SPADs Exposed to Low Neutron Fluxes
2024-01-01 Ratti, L.; Brogi, P.; Collazuol, G.; Betta, G. -F. D.; Delgado, J. C.; Marrocchesi, P. S.; Minga, J.; Morsani, F.; Pancheri, L.; Pino, F.; Selva, A.; Stolzi, F.; Torilla, G.; Vacchi, C.
Radiation effects and underlying damage mechanisms in the dark count rate of CMOS SPADs
2023-01-01 Ratti, L.; Torilla, G.
| Titolo | Data di pubblicazione | Autore(i) | File |
|---|---|---|---|
| A test platform for CMOS SPADs and digital SiPMs in a 110 nm technology | 10-lug-2024 | Torilla, Gianmarco | |
| A Wireless, Battery-Powered Probe Based on a Dual-Tier CMOS SPAD Array for Charged Particle Sensing | 1-gen-2023 | Minga, J; Brogi, P; Collazuol, G; Dalla Betta, Gf; Marrocchesi, Ps; Morsani, F; Pancheri, L; Ratti, L; Torilla, G; Vacchi, C | |
| APiX, a two-tier avalanche pixel sensor for digital charged particle detection | 1-gen-2019 | Brogi, P.; Bigongiari, G.; Checchia, C.; Collazuol, G.; Dalla Betta, G. F.; Ficorella, A.; Marrocchesi, P. S.; Morsani, F.; Musacci, M.; Torilla, G.; Pancheri, L.; Ratti, L.; Savoy-Navarro, A.; Silvestrin, L.; Stolzi, F.; Suh, J. E.; Sulaj, A.; Vacchi, C.; Zarghami, M. | |
| Bulk Damage Effects in Neutron Irradiated Single- and Dual-Layer 150-nm CMOS SPADs | 1-gen-2025 | Shojaei, F.; Brogi, P.; Dalla Betta, G. -F.; Giroletti, S.; Marrocchesi, P. S.; Minga, J.; Pancheri, L.; Ratti, L.; Torilla, G.; Vacchi, C. | |
| Characterization of a Fast Neutron Irradiation Facility Using a Stilbene Scintillation Detector | 1-gen-2024 | Pino, F.; Delgado, J. C.; Polo, M.; Fanchini, E.; Selva, A.; Minga, J.; Torilla, G.; Ratti, L.; Moretto, S. | |
| Cross-talk and RTS Noise Characterization of 1- and 2-tier CMOS SPADs in a 150 nm Process | 1-gen-2021 | Ratti, Lodovico; Brogi, P.; Collazuol, G.; Betta, G. -F. Dalla; Marrocchesi, P. S.; Minga, J.; Morsani, F.; Pancheri, L.; Torilla, G.; Vacchi, C. | |
| DCR and crosstalk characterization of a bi-layered 24 × 72 CMOS SPAD array for charged particle detection | 1-gen-2023 | Torilla, G.; Minga, J.; Brogi, P.; Collazuol, G.; Dalla Betta, G. -F.; Marrocchesi, P. S.; Pancheri, L.; Ratti, L.; Vacchi, C. | |
| DCR Performance in Neutron-Irradiated CMOS SPADs from 150- To 180-nm Technologies | 1-gen-2020 | Ratti, L.; Brogi, P.; Collazuol, G.; Betta, G. -F. D.; Ficorella, A.; Marrocchesi, P. S.; Morsani, F.; Pancheri, L.; Torilla, G.; Vacchi, C. | |
| Experimental results of the pFREYA16 ASIC for x-ray ptychography in continuous wave light sources | 1-gen-2024 | Lazzaroni, P.; Hammer, M.; Manghisoni, M.; Miceli, A.; Ratti, L.; Re, V.; Shi, H.; Torilla, G. | |
| Layered CMOS SPADs for Low Noise Detection of Charged Particles | 1-gen-2021 | Ratti, L.; Brogi, P.; Collazuol, G.; Dalla Betta, G. -F.; Marrocchesi, P. S.; Pancheri, L.; Sulay, A.; Torilla, G.; Vacchi, C. | |
| Online Dark Count Rate Measurements in 150 nm CMOS SPADs Exposed to Low Neutron Fluxes | 1-gen-2024 | Ratti, L.; Brogi, P.; Collazuol, G.; Betta, G. -F. D.; Delgado, J. C.; Marrocchesi, P. S.; Minga, J.; Morsani, F.; Pancheri, L.; Pino, F.; Selva, A.; Stolzi, F.; Torilla, G.; Vacchi, C. | |
| Radiation effects and underlying damage mechanisms in the dark count rate of CMOS SPADs | 1-gen-2023 | Ratti, L.; Torilla, G. |