Spectroscopic ellipsometry of intentionally disordered superlattices

We characterized the electronic properties of ordered and intentionally disordered GaAs–Al(x)Ga(1−xAs) superlattices, with and without dimer-type correlations in the disorder, by means of spectroscopic ellipsometry in the near band-edge region. The spectra have been compared to the calculate electronic structure. The optical transitions in the various superlattices show specific features related to their different electronic structure.



Titolo: Spectroscopic ellipsometry of intentionally disordered superlattices
Autori: 
BELLANI, VITTORIO
PARRAVICINI, GIANBATTISTA
mostra contributor esterni 
Data di pubblicazione: 2004
Rivista: 
MICROELECTRONICS JOURNAL  
Abstract: We characterized the electronic properties of ordered and intentionally disordered GaAs–Al(x)Ga(1−xAs) superlattices, with and without dimer-type correlations in the disorder, by means of spectroscopic ellipsometry in the near band-edge region. The spectra have been compared to the calculate electronic structure. The optical transitions in the various superlattices show specific features related to their different electronic structure.
Handle: http://hdl.handle.net/11571/100605
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http://hdl.handle.net/11571/100605
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