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We characterized the electronic properties of ordered and intentionally disordered GaAs–Al(x)Ga(1−xAs) superlattices, with and without dimer-type correlations in the disorder, by means of spectroscopic ellipsometry in the near band-edge region. The spectra have been compared to the calculate electronic structure. The optical transitions in the various superlattices show specific features related to their different electronic structure.

Spectroscopic ellipsometry of intentionally disordered superlattices

BELLANI, VITTORIO;PARRAVICINI, GIANBATTISTA;
2004-01-01

Abstract

We characterized the electronic properties of ordered and intentionally disordered GaAs–Al(x)Ga(1−xAs) superlattices, with and without dimer-type correlations in the disorder, by means of spectroscopic ellipsometry in the near band-edge region. The spectra have been compared to the calculate electronic structure. The optical transitions in the various superlattices show specific features related to their different electronic structure.
2004
Materials Science and Engineering is concerned with admixtures of matter or the basic matter from which products are made. The category covers ceramics, paper and wood products, polymers, textiles, composites, coatings & films, and biomaterials. Other areas covered in this category include Materials Chemistry, the application of chemistry to materials design and testing; Condensed Matter/Solid State Physics, the branch of physics concerned with the structure and properties of condensed matter (superconductors, semiconductors, ferroelectrics, and dielectrics); and Physical Chemistry/Chemical Physics, the application of the concepts and laws of physics to chemical phenomena.
MICROELECTRONICS JOURNAL
sì
Sì, ma tipo non specificato
Inglese
Internazionale
ELETTRONICO
35
1
59
61
Published since 1969, Microelectronics Journal is an international forum for the dissemination of research into, and applications of, microelectronics. Papers published in Microelectronics Journal have undergone peer review to ensure originality, relevance and timeliness. The journal thus provides a worldwide, regular and comprehensive update on microelectronics Microelectronics Journal invites significant research and application papers in all the areas listed below: • Analogue, digital, mixed, and RF circuit design methodologies • Logic, architectural and system level synthesis • Testing, design for testability, built in self-test • Area, power and thermal evaluation • Mixed-domain simulation and design • Formal verification • Embedded systems • Design and test aspects of high density integration (3D, etc.) • SoC, NoC, SIP, NIP design and test • Emerging devices as FinFETs, SETs, etc.
Electronic Structure; Correlations; Superlattices
http://dx.doi.org/10.1016/S0026-2692(03)00223-4
5
info:eu-repo/semantics/article
262
Dominguez Adame, F.; Hey, R.; Bellani, Vittorio; Parravicini, Gianbattista; Diez, E.
1 Contributo su Rivista::1.1 Articolo in rivista
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1.1 Articolo in rivista
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11571/100605
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