We investigate the effect of unintentional disorder on the pass-band capabilities of a GaAs-Al(x)Ga(1-x)As superlattice with Gaussian modulated Al mole fraction. We prove that if fluctuations of vertical disorder can be kept below two monolayers the pass-band filter capabilities are not severely degraded. In addition Al fluctuation as encountered in typical molecular beam epitaxy growth conditions does not degrade the filter capabilities of the Gaussian superlattice. We introduce a new model to deal with lateral disorder and prove that in a molecular beam epitaxial growth process lateral disorder effects are negligible as compared with the vertical disorder ones.

Interface roughness effects in Gaussian superlattices

BELLANI, VITTORIO;
2001-01-01

Abstract

We investigate the effect of unintentional disorder on the pass-band capabilities of a GaAs-Al(x)Ga(1-x)As superlattice with Gaussian modulated Al mole fraction. We prove that if fluctuations of vertical disorder can be kept below two monolayers the pass-band filter capabilities are not severely degraded. In addition Al fluctuation as encountered in typical molecular beam epitaxy growth conditions does not degrade the filter capabilities of the Gaussian superlattice. We introduce a new model to deal with lateral disorder and prove that in a molecular beam epitaxial growth process lateral disorder effects are negligible as compared with the vertical disorder ones.
2001
The Physics category includes resources of a broad, general nature that contain materials from all areas of physics, The category also includes resources specifically concerned with the following physics sub-fields: mathematical physics, particle and nuclear physics, physics of fluids and plasmas, quantum physics, and theoretical physics.
Sì, ma tipo non specificato
Inglese
Internazionale
STAMPA
16
304
309
6
Semiconductor Science and Technology covers: Semiconductor Science and Technology covers applied or explicitly applicable experimental and theoretical studies of the properties of semiconductors and their interfaces, devices and packaging, including: -electrical properties -optical properties -device design -device fabrication -materials processing -materials and device analysis -process monitoring -reliability
Interface Defects; Gaussian Superlattices; Electric Transport
http://dx.doi.org/10.1088/0268-1242/16/5/305
5
info:eu-repo/semantics/article
262
F., Banfi; Bellani, Vittorio; I., Gómez; E., Diez; F., Domínguez Adame
1 Contributo su Rivista::1.1 Articolo in rivista
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11571/100610
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