We studied the optical properties of high quality GaSb layers, grown by molecular beam epitaxy, in the region of the fundamental gap E0 using thermoreflectance spectroscopy in the temperature range between 80 and 300 K. The experimental line-shapes were analyzed with a functional form model including excitonic effects. Taking advantage of the derivative-like nature of the thermoreflectance spectroscopy, an accurate determination of the temperature dependence of the energy gap E0(T) is obtained, which is well reproduced by the semi-empirical Varshni relation.

TERMOREFLECTANCE STUDY OF THE DIRECT ENERGY GAP OF GASB

BELLANI, VITTORIO;GEDDO, MARIO;GUIZZETTI, GIORGIO;
1997-01-01

Abstract

We studied the optical properties of high quality GaSb layers, grown by molecular beam epitaxy, in the region of the fundamental gap E0 using thermoreflectance spectroscopy in the temperature range between 80 and 300 K. The experimental line-shapes were analyzed with a functional form model including excitonic effects. Taking advantage of the derivative-like nature of the thermoreflectance spectroscopy, an accurate determination of the temperature dependence of the energy gap E0(T) is obtained, which is well reproduced by the semi-empirical Varshni relation.
1997
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Sì, ma tipo non specificato
Inglese
Internazionale
STAMPA
104
81
84
Semiconductors, Epitaxy, Optical properties
7
info:eu-repo/semantics/article
262
Bellani, Vittorio; S., DI LERNIA; Geddo, Mario; Guizzetti, Giorgio; A., Bosacchi; S., Franchi; R., Magnanini
1 Contributo su Rivista::1.1 Articolo in rivista
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11571/106288
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