A remote controlled system to maintain polarization voltage across a silicon detector within a user defined window is described. The system regulates silicon bias voltage, caused by increased leakage current due to radiation damage, by switching external resistors to maintain a constant voltage drop across the bias load resistor, independent of leakage current. This Z80 microprocessor based system links with the host computer by a RS-232 serial port. The voltage resolution of the system is less than 0.2 V in the worst case

An automated system to control the polarization voltage of silicon detectors

ALTIERI, SAVERIO;FOSSATI, FRANCESCA;LANZA, AGOSTINO;PINELLI, TAZIO
1995-01-01

Abstract

A remote controlled system to maintain polarization voltage across a silicon detector within a user defined window is described. The system regulates silicon bias voltage, caused by increased leakage current due to radiation damage, by switching external resistors to maintain a constant voltage drop across the bias load resistor, independent of leakage current. This Z80 microprocessor based system links with the host computer by a RS-232 serial port. The voltage resolution of the system is less than 0.2 V in the worst case
1995
The Electrical and Electronics Engineering category covers resources concerned with applications of electricity, generally those involving current flow through conductors, as in motors and generators. This category also covers the examination of the conduction of electricity through gases or a vacuum as well as through semiconducting materials. Topics include image and signal processing, electromagnetics, electronic components and materials, microwave technology, and microelectronics.
Sì, ma tipo non specificato
Inglese
Internazionale
STAMPA
42
2
57
60
4
Silicon detector; polarization control
4
info:eu-repo/semantics/article
262
Altieri, Saverio; Fossati, Francesca; Lanza, Agostino; Pinelli, Tazio
1 Contributo su Rivista::1.1 Articolo in rivista
none
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11571/108656
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