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EnglishWaveguides obtained by proton exchange in LiNbO3 were characterized by Secondary Ion Mass Spectrometry and m-lines technique. Additional micro-Raman investigations evidenced marked changes in the spectra of the waveguide with respect to the substrate. This suggests that micro-Raman spectroscopy may constitute a direct non-destructive method to determine the depth of the exchanged layer, with a limit which is set by the diffraction-limited spot size
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| Titolo: | Characterization of waveguides obtained by proton exchange on a LiNbO3 substrate |
| Autori: | |
| Data di pubblicazione: | 2001 |
| Rivista: | |
| Abstract: | Waveguides obtained by proton exchange in LiNbO3 were characterized by Secondary Ion Mass Spectrometry and m-lines technique. Additional micro-Raman investigations evidenced marked changes in the spectra of the waveguide with respect to the substrate. This suggests that micro-Raman spectroscopy may constitute a direct non-destructive method to determine the depth of the exchanged layer, with a limit which is set by the diffraction-limited spot size |
| Handle: | http://hdl.handle.net/11571/109184 |
| Appare nelle tipologie: | 1.1 Articolo in rivista |
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http://hdl.handle.net/11571/109184
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