Semi-insulating SI GaAs samples from a zone refined crystal were irradiated with high energy protons (24 GeV/c, fluences up to 1.64×1014 p/cm2). Optical spectra in transmittance and reflectance were accurately measured in the energy range of 0.6–1.4 eV to determine, through the absorption coefficient, the concentrations of both neutral and ionized EL2 defects as a function of the proton fluence. Both these concentrations have been shown to increase linearly with the proton fluence; this behavior well explains the remarkable decrease of the charge collection efficiency observed in proton irradiated GaAs detectors at doses associated with high luminosity beams at a new particle collider accelerator (e.g., the LHC at the CERN laboratory).

Optical Evaluation of the Ionized EL2 Fraction in Proton (24 GeV) Irradiated Semi-Insulating GaAs

GALLI, MATTEO;GUIZZETTI, GIORGIO;PATRINI, MADDALENA;
1997-01-01

Abstract

Semi-insulating SI GaAs samples from a zone refined crystal were irradiated with high energy protons (24 GeV/c, fluences up to 1.64×1014 p/cm2). Optical spectra in transmittance and reflectance were accurately measured in the energy range of 0.6–1.4 eV to determine, through the absorption coefficient, the concentrations of both neutral and ionized EL2 defects as a function of the proton fluence. Both these concentrations have been shown to increase linearly with the proton fluence; this behavior well explains the remarkable decrease of the charge collection efficiency observed in proton irradiated GaAs detectors at doses associated with high luminosity beams at a new particle collider accelerator (e.g., the LHC at the CERN laboratory).
1997
The Physics category includes resources of a broad, general nature that contain materials from all areas of physics, The category also includes resources specifically concerned with the following physics sub-fields: mathematical physics, particle and nuclear physics, physics of fluids and plasmas, quantum physics, and theoretical physics.
Sì, ma tipo non specificato
Inglese
Internazionale
STAMPA
71
21
3084
3086
High purity GaAs Impurities characterization Optical absorbance
http://apl.aip.org/resource/1/applab/v71/i21/p3084_s1
7
info:eu-repo/semantics/article
262
R., Ferrini; Galli, Matteo; Guizzetti, Giorgio; Patrini, Maddalena; F., Nava; C., Canali; P., Vanni
1 Contributo su Rivista::1.1 Articolo in rivista
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11571/115314
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