The optical properties of C60 thin films are investigated in the energy range 0.4 to 32 eV using reflectance, transmittance, and ellipsometric spectroscopies. The complex dielectric constant and the associated functions are determined by a combination of photometric and ellipsometric data and by Kramers-Kronig transformations. Spectral features above the fundamental absorption edge (at ≈ 1.8eV) are related to both one-electron interband transitions and collective electron effects. A comparison is made with recent results of electron energy loss spectroscopy and of theoretical calculations on the f.c.c. fullerite structure.

Optical properties of fullerite thin films in the 0.4 to 32 energy range

GUIZZETTI, GIORGIO;MARABELLI, FRANCO;PATRINI, MADDALENA;
1994-01-01

Abstract

The optical properties of C60 thin films are investigated in the energy range 0.4 to 32 eV using reflectance, transmittance, and ellipsometric spectroscopies. The complex dielectric constant and the associated functions are determined by a combination of photometric and ellipsometric data and by Kramers-Kronig transformations. Spectral features above the fundamental absorption edge (at ≈ 1.8eV) are related to both one-electron interband transitions and collective electron effects. A comparison is made with recent results of electron energy loss spectroscopy and of theoretical calculations on the f.c.c. fullerite structure.
1994
The Physics category includes resources of a broad, general nature that contain materials from all areas of physics, The category also includes resources specifically concerned with the following physics sub-fields: mathematical physics, particle and nuclear physics, physics of fluids and plasmas, quantum physics, and theoretical physics.
Sì, ma tipo non specificato
Inglese
Internazionale
STAMPA
183
1
267
275
Fullerite; thin films; reflectance
http://onlinelibrary.wiley.com/doi/10.1002/pssb.2221830122/abstract
8
info:eu-repo/semantics/article
262
Guizzetti, Giorgio; Marabelli, Franco; Patrini, Maddalena; V., Capozzi; G., Lorusso; A., Minafra; M., Manfredini; P., Milani
1 Contributo su Rivista::1.1 Articolo in rivista
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11571/115444
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