IRIS

Comparison of ionizing radiation effects in 0.18 and 0.25 um CMOS technologies for analog applications

RATTI, LODOVICO;SPEZIALI, VALERIA;
2003-01-01
2003
The Electrical and Electronics Engineering category covers resources concerned with applications of electricity, generally those involving current flow through conductors, as in motors and generators. This category also covers the examination of the conduction of electricity through gases or a vacuum as well as through semiconducting materials. Topics include image and signal processing, electromagnetics, electronic components and materials, microwave technology, and microelectronics.
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
sì
WOS:000188837800014
2-s2.0-1242265284
Esperti anonimi
Inglese
Internazionale
STAMPA
50
1827
1833
7
ionizing radiation effects; scaling effects; deep submicron CMOS processes
no
6
info:eu-repo/semantics/article
262
Manghisoni, M.; Ratti, Lodovico; Re, V.; Speziali, Valeria; Traversi, G.; Candelori, A.
1 Contributo su Rivista::1.1 Articolo in rivista
none
1.1 Articolo in rivista
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11571/117151
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 44
  • ???jsp.display-item.citation.isi??? 37
social impact