We optimized a Kerr-lens mode-locked (KLM) femtosecond Cr:forsterite laser using a five-mirror cavity, taking advantage of its peculiar low misalignment sensitivity and using an effective KLM mapping technique. A simple scanning nonlinear microscope based on this laser source has been developed and second harmonic images of the layered structure of a microchip are presented.
Low misalignment sensitivity Kerr-lens mode-locked femtosecond Cr4+:forsterite laser for nonlinear microscopy
AGNESI, ANTONIANGELO;GUANDALINI, ANNALISA;LUCCA, ANDREA;REALI, GIANCARLO;TOMASELLI, ALESSANDRA;VACCHI, CARLA
2004-01-01
Abstract
We optimized a Kerr-lens mode-locked (KLM) femtosecond Cr:forsterite laser using a five-mirror cavity, taking advantage of its peculiar low misalignment sensitivity and using an effective KLM mapping technique. A simple scanning nonlinear microscope based on this laser source has been developed and second harmonic images of the layered structure of a microchip are presented.File in questo prodotto:
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