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Radiation hardness perspectives for the design of analog detector readout circuits in the 0.18 um CMOS generation

RATTI, LODOVICO;SPEZIALI, VALERIA
2002-01-01
2002
The Electrical and Electronics Engineering category covers resources concerned with applications of electricity, generally those involving current flow through conductors, as in motors and generators. This category also covers the examination of the conduction of electricity through gases or a vacuum as well as through semiconducting materials. Topics include image and signal processing, electromagnetics, electronic components and materials, microwave technology, and microelectronics.
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
sì
WOS:000180056800044
2-s2.0-0036952546
Esperti anonimi
Inglese
Internazionale
STAMPA
49
6
2902
2909
8
ionizing radiation damage; deep submicron CMOS; front-end electronics
no
4
info:eu-repo/semantics/article
262
Manghisoni, M.; Ratti, Lodovico; Re, V.; Speziali, Valeria
1 Contributo su Rivista::1.1 Articolo in rivista
none
1.1 Articolo in rivista
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11571/133453
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