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Survey of noise performances and scaling effects in deep submicron CMOS devices from different foundries

RATTI, LODOVICO;SPEZIALI, VALERIA;
2005-01-01
2005
The Electrical and Electronics Engineering category covers resources concerned with applications of electricity, generally those involving current flow through conductors, as in motors and generators. This category also covers the examination of the conduction of electricity through gases or a vacuum as well as through semiconducting materials. Topics include image and signal processing, electromagnetics, electronic components and materials, microwave technology, and microelectronics.
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
sì
WOS:000235371900004
2-s2.0-33144481325
Esperti anonimi
Inglese
Internazionale
STAMPA
52
6
2733
2740
8
CMOS technology scaling; white noise; flicker noise; deep submicron CMOS processes
no
5
info:eu-repo/semantics/article
262
Manghisoni, M.; Ratti, Lodovico; Re, V.; Speziali, Valeria; Traversi, G.
1 Contributo su Rivista::1.1 Articolo in rivista
none
1.1 Articolo in rivista
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11571/134081
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