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Proton induced damage in JFET transistors and charge preamplifiers on high-resistivity silicon

RATTI, LODOVICO;SPEZIALI, VALERIA;
2004-01-01
2004
The Electrical and Electronics Engineering category covers resources concerned with applications of electricity, generally those involving current flow through conductors, as in motors and generators. This category also covers the examination of the conduction of electricity through gases or a vacuum as well as through semiconducting materials. Topics include image and signal processing, electromagnetics, electronic components and materials, microwave technology, and microelectronics.
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
sì
WOS:000224491400026
2-s2.0-8444235652
Esperti anonimi
Inglese
Internazionale
STAMPA
51
5
2880
2886
7
non ionizing radiation effects; junction field-effect transistors; electronic noise
no
7
info:eu-repo/semantics/article
262
Dalla Betta, G. F.; Manghisoni, M.; Ratti, Lodovico; Re, V.; Speziali, Valeria; Traversi, G.; Candelori, A.
1 Contributo su Rivista::1.1 Articolo in rivista
none
1.1 Articolo in rivista
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11571/137664
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