The design of an integrated optic Michelson interferometer sensor for stress, temperature, and microdisplacement measurements consisting of a semi-asymmetric X-junction made by Ti in-diffused LiNbO3 waveguides is reported. The possibility of performing simultaneous measurements of strain and temperature is investigated, and different calibration schemes are proposed. Experimental results of displacement-only measurements show a 64% intensity modulation with 33-dB optical loss.
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