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Investigating Degradation Mechanisms in 130 nm and 90 nm Commercial CMOS Technologies Under Extreme Radiation Conditions

RATTI, LODOVICO;
2008-01-01
2008
The Electrical and Electronics Engineering category covers resources concerned with applications of electricity, generally those involving current flow through conductors, as in motors and generators. This category also covers the examination of the conduction of electricity through gases or a vacuum as well as through semiconducting materials. Topics include image and signal processing, electromagnetics, electronic components and materials, microwave technology, and microelectronics.
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
sì
WOS:000259899500015
2-s2.0-53349145795
Esperti anonimi
Inglese
Internazionale
STAMPA
55
4
1992
2000
9
radiation effect modeling; nanoscale CMOS; noise measurements; shallow trench isolation
no
5
info:eu-repo/semantics/article
262
Ratti, Lodovico; Gaioni, L.; Manghisoni, M.; Traversi, G.; Pantano, D.
1 Contributo su Rivista::1.1 Articolo in rivista
none
1.1 Articolo in rivista
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11571/144269
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