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Comprehensive Study of Total Ionizing Dose Damage Mechanisms and Their Effects on Noise Sources in a 90 nm CMOS Technology

RATTI, LODOVICO;
2008-01-01
2008
The Electrical and Electronics Engineering category covers resources concerned with applications of electricity, generally those involving current flow through conductors, as in motors and generators. This category also covers the examination of the conduction of electricity through gases or a vacuum as well as through semiconducting materials. Topics include image and signal processing, electromagnetics, electronic components and materials, microwave technology, and microelectronics.
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
sì
WOS:000262713400064
2-s2.0-58849135792
Esperti anonimi
Inglese
Internazionale
STAMPA
55
6
3272
3279
8
ionizing radiation effects; shallow trench isolation; nanoscale CMOS; noise measurements
no
5
info:eu-repo/semantics/article
262
Re, V; Gaioni, L.; Manghisoni, M.; Ratti, Lodovico; Traversi, G.
1 Contributo su Rivista::1.1 Articolo in rivista
none
1.1 Articolo in rivista
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11571/144271
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