This article presents a MOS-based ON-chip temperature sensor system addressing both high-resolution and lowinaccuracy requirement, red while requiring a single temperature calibration point. Hence, the proposed temperature sensor system proves to be a low-cost solution, well addressing the requirements of the spreading market of system-on-chips (SoCs), mobile and wearable devices, and consumer electronics in general. The temperature sensor features a two-phase time-domain architecture, which employs as a sensing element a single NMOS transistor, biased alternatively with different currents, thus allowing achieving an inherent inaccuracy reduction. The proposed sensory system, fabricated in a standard 130-nm CMOS process, comprises, along the sensor core, a switched-capacitor analog interface circuit and a 1-bit second-order sigma-delta analog-to-digital converter (ADC). The proposed temperatureto-digital converter (TDC), experimentally characterized considering a batch of 16 samples, achieves 40-mK resolution at 20-kHz switching frequency and +0.75/-0.92. C inaccuracy across the -40 degrees C-90 degrees C temperature range after one-point calibration at room temperature, consuming 25.4 uW, including the analog buffer added for testing purposes.
A MOS-Based Temperature Sensor With Inherent Inaccuracy Reduction Enabled by Time-Domain Operation
Moisello, E
;Malcovati, P;Bonizzoni, E
2023-01-01
Abstract
This article presents a MOS-based ON-chip temperature sensor system addressing both high-resolution and lowinaccuracy requirement, red while requiring a single temperature calibration point. Hence, the proposed temperature sensor system proves to be a low-cost solution, well addressing the requirements of the spreading market of system-on-chips (SoCs), mobile and wearable devices, and consumer electronics in general. The temperature sensor features a two-phase time-domain architecture, which employs as a sensing element a single NMOS transistor, biased alternatively with different currents, thus allowing achieving an inherent inaccuracy reduction. The proposed sensory system, fabricated in a standard 130-nm CMOS process, comprises, along the sensor core, a switched-capacitor analog interface circuit and a 1-bit second-order sigma-delta analog-to-digital converter (ADC). The proposed temperatureto-digital converter (TDC), experimentally characterized considering a batch of 16 samples, achieves 40-mK resolution at 20-kHz switching frequency and +0.75/-0.92. C inaccuracy across the -40 degrees C-90 degrees C temperature range after one-point calibration at room temperature, consuming 25.4 uW, including the analog buffer added for testing purposes.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
