This article addresses key limiting factors in the development of inertial navigation systems (INSs) based on MEMS inertial sensors, focusing on the long-term impact of low-frequency noise on the stability and accuracy of MEMS gyroscopes used in inertial measurement units (IMUs). We highlight the Allan deviation (ADEV) method as a systematic tool for identifying and quantifying the effects of technological defects that compromise sensor performance. In addition, we propose and calibrate a noise generation technique, based on measurements, which, in conjunction with the ADEV plot, identifies random telegraph noise (RTN) as a significant threat to commercial gyroscopes. Our findings aim to improve the reliability, performance, and yield of MEMS sensors by incorporating the noise sources and the design of the gyroscope into emulation platforms, overcoming the limitation posed by common CAD tools in evaluating very low-frequency noise.

Random Telegraph Noise in MEMS Gyroscopes: Modeling and Design Flow Enhancements Toward Autonomous Driving Sensor Design

Cantini C.
;
Aprile A.;Bonizzoni E.;Malcovati P.
2025-01-01

Abstract

This article addresses key limiting factors in the development of inertial navigation systems (INSs) based on MEMS inertial sensors, focusing on the long-term impact of low-frequency noise on the stability and accuracy of MEMS gyroscopes used in inertial measurement units (IMUs). We highlight the Allan deviation (ADEV) method as a systematic tool for identifying and quantifying the effects of technological defects that compromise sensor performance. In addition, we propose and calibrate a noise generation technique, based on measurements, which, in conjunction with the ADEV plot, identifies random telegraph noise (RTN) as a significant threat to commercial gyroscopes. Our findings aim to improve the reliability, performance, and yield of MEMS sensors by incorporating the noise sources and the design of the gyroscope into emulation platforms, overcoming the limitation posed by common CAD tools in evaluating very low-frequency noise.
2025
Electrical & Electronics Engineering
Esperti anonimi
Inglese
Internazionale
ELETTRONICO
74
1
12
12
Allan variance (AVAR); bias instability (BI); burst noise; flicker noise; MEMS gyroscopes; popcorn noise; random telegraph noise (RTN)
no
9
info:eu-repo/semantics/article
262
Cantini, C.; Aprile, A.; Pellegrini, A.; Pinna, C.; Radaelli, G.; Gardino, D.; Folz, M.; Bonizzoni, E.; Malcovati, P.
1 Contributo su Rivista::1.1 Articolo in rivista
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11571/1531736
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