The Belle II experiment at the SuperKEKB collider in Japan, which currently holds the world luminosity record for electron–positron collisions, plans to upgrade its vertex detector (VXD) to operate at a target luminosity of 6×1035 cm−2s−1. A new pixelated vertex detector (VTX) is under development, utilizing a monolithic CMOS pixel sensor named OBELIX (Optimized BELle II pIXel). The VTX design incorporates 5–6 layers with a total material budget below 2.5% X0. All layers will employ the OBELIX, adapted from the TJ-Monopix2 sensor initially designed for the ATLAS Inner Tracker (ITk) upgrade. The OBELIX sensor, designed using a 180 nm CMOS process, features an enhanced pixel matrix and additional functionalities compared to its predecessor. Laboratory tests and test beam characterization results on irradiated and unirradiated TJ-Monopix2 sensors have yielded promising results, confirming the key performance parameters for the OBELIX design. This paper reviews the overall design of the VTX and the OBELIX sensor and presents the latest results of the in-beam characterization of the TJ-Monopix2.

Upgrade of the Belle II vertex detector with depleted monolithic CMOS active pixel sensors

Barbero, M.;Bettarini, S.;Corona, L.;Gaioni, L.;Giroletti, S.;Minuti, M.;Pham, H.;Ratti, L.;Traversi, G.;Xu, D.
2025-01-01

Abstract

The Belle II experiment at the SuperKEKB collider in Japan, which currently holds the world luminosity record for electron–positron collisions, plans to upgrade its vertex detector (VXD) to operate at a target luminosity of 6×1035 cm−2s−1. A new pixelated vertex detector (VTX) is under development, utilizing a monolithic CMOS pixel sensor named OBELIX (Optimized BELle II pIXel). The VTX design incorporates 5–6 layers with a total material budget below 2.5% X0. All layers will employ the OBELIX, adapted from the TJ-Monopix2 sensor initially designed for the ATLAS Inner Tracker (ITk) upgrade. The OBELIX sensor, designed using a 180 nm CMOS process, features an enhanced pixel matrix and additional functionalities compared to its predecessor. Laboratory tests and test beam characterization results on irradiated and unirradiated TJ-Monopix2 sensors have yielded promising results, confirming the key performance parameters for the OBELIX design. This paper reviews the overall design of the VTX and the OBELIX sensor and presents the latest results of the in-beam characterization of the TJ-Monopix2.
2025
The Electrical and Electronics Engineering category covers resources concerned with applications of electricity, generally those involving current flow through conductors, as in motors and generators. This category also covers the examination of the conduction of electricity through gases or a vacuum as well as through semiconducting materials. Topics include image and signal processing, electromagnetics, electronic components and materials, microwave technology, and microelectronics.
Esperti anonimi
Inglese
Internazionale
ELETTRONICO
1080
Belle II; CMOS pixel sensor; Depleted monolithic active pixel sensor; Front-end electronics for detector readout; In-beam characterization; Particle tracking detectors; Vertex detector upgrade; VTX
84
info:eu-repo/semantics/article
262
Boudagga, R.; Auguste, D.; Babeluk, M.; Barbero, M.; Barrillon, P.; Baudot, J.; Bergauer, T.; Bernlochner, F.; Bertolone, G.; Bespin, C.; Bettarini, S...espandi
1 Contributo su Rivista::1.1 Articolo in rivista
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11571/1534398
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