The Belle II experiment, operating at the SuperKEKBe+e- collider, is developing a new pixelated vertex detector (VTX) to handle an higher luminosity, up to 6 × 1035cm-2s-1. The VTX will feature 5–6 layers, with a material budget under 3% ofX 0, and will utilize depleted monolithic active pixel sensors. The chip developed for the upgrade of the vertex detector, OBELIX, is based on the TJ-Monopix2 sensor which uses Tower Semiconductor 180 nm CMOS process. OBELIX sensor offers a 33 μm pitch, 50 ns time-stamping, and a digital trigger logic that matches Belle II's 30 kHz trigger rate. The sensor is designed to withstand radiation levels up to 5 × 1014neq/cm2and 1 MGy while maintaining low power dissipation (200 mW/cm2). This paper outlines the motivation for the upgrade and the VTX concept, and presents characterisation results and beam test campaigns on the TJ-Monopix2 sensor, including both non-irradiated and irradiated samples, which are crucial for validating key performance characteristics for the OBELIX design.

Upgrade of the Belle II Vertex Detector with Depleted Monolithic Active Pixel Sensors

Barbero M.;Bettarini S.;Corona L.;Gaioni L.;Giroletti S.;Minuti M.;Pham H.;Ratti L.;Traversi G.;Xu D.
2025-01-01

Abstract

The Belle II experiment, operating at the SuperKEKBe+e- collider, is developing a new pixelated vertex detector (VTX) to handle an higher luminosity, up to 6 × 1035cm-2s-1. The VTX will feature 5–6 layers, with a material budget under 3% ofX 0, and will utilize depleted monolithic active pixel sensors. The chip developed for the upgrade of the vertex detector, OBELIX, is based on the TJ-Monopix2 sensor which uses Tower Semiconductor 180 nm CMOS process. OBELIX sensor offers a 33 μm pitch, 50 ns time-stamping, and a digital trigger logic that matches Belle II's 30 kHz trigger rate. The sensor is designed to withstand radiation levels up to 5 × 1014neq/cm2and 1 MGy while maintaining low power dissipation (200 mW/cm2). This paper outlines the motivation for the upgrade and the VTX concept, and presents characterisation results and beam test campaigns on the TJ-Monopix2 sensor, including both non-irradiated and irradiated samples, which are crucial for validating key performance characteristics for the OBELIX design.
2025
The Electrical and Electronics Engineering category covers resources concerned with applications of electricity, generally those involving current flow through conductors, as in motors and generators. This category also covers the examination of the conduction of electricity through gases or a vacuum as well as through semiconducting materials. Topics include image and signal processing, electromagnetics, electronic components and materials, microwave technology, and microelectronics.
Esperti anonimi
Inglese
Internazionale
ELETTRONICO
20
10
Particle tracking detectors (Solid-state detectors); Radiation-hard detectors; Solid state detectors
84
info:eu-repo/semantics/article
262
Auguste, D.; Babeluk, M.; Barbero, M.; Barrillon, P.; Baudot, J.; Bergauer, T.; Bernlochner, F.; Bertolone, G.; Bespin, C.; Bettarini, S.; Bevan, A.; ...espandi
1 Contributo su Rivista::1.1 Articolo in rivista
none
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11571/1534400
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 0
  • ???jsp.display-item.citation.isi??? ND
social impact