Targeting a peak luminosity of 6 × 1035 cm-2s-1, the Belle II experiment at the SuperKEKB in Japan is considering an upgrade of its interaction region. This upgrade involves the vertex detector, which will be replaced by a new fully pixelated vertex detector (VTX). A monolithic CMOS pixel sensor named OBELIX (Optimized BELle II pIXel) is proposed to be used in the VTX. Based on the existing TJ-Monopix2 chip initially developed for the ATLAS Inner Tracker (ITk) upgrade, OBELIX is designed in a 180 nm CMOS process with an improved pixel matrix and additional functionalities such as new on-chip voltage regulators and digital periphery. This paper will review the overall design of the VTX and the OBELIX sensor.

Design of the OBELIX monolithic CMOS pixel sensor for the Belle II vertex detector upgrade

Barbero M.;Bettarini S.;Corona L.;Gaioni L.;Giroletti S.;Minuti M.;Pham H.;Ratti L.;Traversi G.;Xu D.
2025-01-01

Abstract

Targeting a peak luminosity of 6 × 1035 cm-2s-1, the Belle II experiment at the SuperKEKB in Japan is considering an upgrade of its interaction region. This upgrade involves the vertex detector, which will be replaced by a new fully pixelated vertex detector (VTX). A monolithic CMOS pixel sensor named OBELIX (Optimized BELle II pIXel) is proposed to be used in the VTX. Based on the existing TJ-Monopix2 chip initially developed for the ATLAS Inner Tracker (ITk) upgrade, OBELIX is designed in a 180 nm CMOS process with an improved pixel matrix and additional functionalities such as new on-chip voltage regulators and digital periphery. This paper will review the overall design of the VTX and the OBELIX sensor.
2025
The Electrical and Electronics Engineering category covers resources concerned with applications of electricity, generally those involving current flow through conductors, as in motors and generators. This category also covers the examination of the conduction of electricity through gases or a vacuum as well as through semiconducting materials. Topics include image and signal processing, electromagnetics, electronic components and materials, microwave technology, and microelectronics.
Esperti anonimi
Inglese
Internazionale
ELETTRONICO
20
2
Analogue electronic circuits; Electronic detector readout concepts (solid-state); Front-end electronics for detector readout; Radiation-hard electronics
83
info:eu-repo/semantics/article
262
Boudagga, R.; Auguste, D.; Babeluk, M.; Barbero, M.; Barrillon, P.; Baudot, J.; Bergauer, T.; Bernlochner, F.; Bertolone, G.; Bespin, C.; Bettarini, S...espandi
1 Contributo su Rivista::1.1 Articolo in rivista
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11571/1534406
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