A specific preparation procedure makes possible to obtain in one shot structural and compositional characterization of a buried interface at the nanometre scale using a micrometre scale probe. A specific example based on dispersive l-XAS, micro X-ray absorption spectroscopy, shows that nearly-atomic scale changes in local structure, composition, as well as local disorder are faithfully detected. The approach could in principle be applied to any probe with a micrometric resolution.

micro-XANES mapping of buried interfaces: pushing microbeam techniques to the nanoscale

GHIGNA, PAOLO;SPINOLO, GIORGIO;ZEMA, MICHELE;TARANTINO, SERENA CHIARA;
2010-01-01

Abstract

A specific preparation procedure makes possible to obtain in one shot structural and compositional characterization of a buried interface at the nanometre scale using a micrometre scale probe. A specific example based on dispersive l-XAS, micro X-ray absorption spectroscopy, shows that nearly-atomic scale changes in local structure, composition, as well as local disorder are faithfully detected. The approach could in principle be applied to any probe with a micrometric resolution.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11571/209891
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