We introduce a technique to measure transparent glass slab thickness. It employs a very simple setup combining two interferometers: a forward-going beam scheme and a self-mixing readout of the beam reflected back to the laser source. Interestingly, the difference of the two readouts provides a quantity related to thickness measurement, irrespective of refractive index. We demonstrate this method using samples on a range of thickness from 30 to 1000 μm.

Thickness measurement of transparent platesby a self-mixing interferometer

FATHI, MOHAMMAD TAGHI;DONATI, SILVANO
2010-01-01

Abstract

We introduce a technique to measure transparent glass slab thickness. It employs a very simple setup combining two interferometers: a forward-going beam scheme and a self-mixing readout of the beam reflected back to the laser source. Interestingly, the difference of the two readouts provides a quantity related to thickness measurement, irrespective of refractive index. We demonstrate this method using samples on a range of thickness from 30 to 1000 μm.
2010
The Electrical and Electronics Engineering category covers resources concerned with applications of electricity, generally those involving current flow through conductors, as in motors and generators. This category also covers the examination of the conduction of electricity through gases or a vacuum as well as through semiconducting materials. Topics include image and signal processing, electromagnetics, electronic components and materials, microwave technology, and microelectronics.
Sì, ma tipo non specificato
Inglese
Internazionale
ELETTRONICO
35
11
1844
1846
OCIS codes: 120.0120, 120.3180.
interferometry; self-mixing; electrooptical instrumentation
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-35-11-1844
2
info:eu-repo/semantics/article
262
Fathi, MOHAMMAD TAGHI; Donati, Silvano
1 Contributo su Rivista::1.1 Articolo in rivista
none
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11571/216682
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