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Mechanisms of noise degradation in low power 65 nm CMOS transistors exposed to ionizing radiation

RATTI, LODOVICO;
2010-01-01
2010
The Electrical and Electronics Engineering category covers resources concerned with applications of electricity, generally those involving current flow through conductors, as in motors and generators. This category also covers the examination of the conduction of electricity through gases or a vacuum as well as through semiconducting materials. Topics include image and signal processing, electromagnetics, electronic components and materials, microwave technology, and microelectronics.
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
sì
WOS:000285355200010
2-s2.0-78650415753
Esperti anonimi
Inglese
Internazionale
STAMPA
57
6
3071
3077
7
CMOS; ionizing radiation; noise
no
5
info:eu-repo/semantics/article
262
Re, V.; Gaioni, L.; Manghisoni, M.; Ratti, Lodovico; Traversi, G.
1 Contributo su Rivista::1.1 Articolo in rivista
none
1.1 Articolo in rivista
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11571/267706
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