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TID-Induced Degradation in Static and Noise Behavior of Sub-100 nm Multifinger Bulk NMOSFETs

RATTI, LODOVICO;
2011-01-01
2011
The Electrical and Electronics Engineering category covers resources concerned with applications of electricity, generally those involving current flow through conductors, as in motors and generators. This category also covers the examination of the conduction of electricity through gases or a vacuum as well as through semiconducting materials. Topics include image and signal processing, electromagnetics, electronic components and materials, microwave technology, and microelectronics.
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
sì
WOS:000291657900005
2-s2.0-79959372974
Esperti anonimi
Inglese
Internazionale
STAMPA
58
3
776
784
9
ionizing radiation effects; electronic noise; nanoscale CMOS; shallow trench isolation
no
5
info:eu-repo/semantics/article
262
Ratti, Lodovico; Gaioni, L.; Manghisoni, M.; Re, V.; Traversi, G.
1 Contributo su Rivista::1.1 Articolo in rivista
none
1.1 Articolo in rivista
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11571/267708
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