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Impact of Lateral Isolation Oxides on Radiation-Induced Noise Degradation in CMOS Technologies in the 100-nm Regime

RATTI, LODOVICO;SPEZIALI, VALERIA;
2007-01-01
2007
The Electrical and Electronics Engineering category covers resources concerned with applications of electricity, generally those involving current flow through conductors, as in motors and generators. This category also covers the examination of the conduction of electricity through gases or a vacuum as well as through semiconducting materials. Topics include image and signal processing, electromagnetics, electronic components and materials, microwave technology, and microelectronics.
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
sì
WOS:000251744300054
2-s2.0-37249080731
Esperti anonimi
Inglese
Internazionale
STAMPA
54
3
2218
2226
9
shallow trench isolation; deep sub micron CMOS; electronic noise; ionizing radiation effects
no
5
info:eu-repo/semantics/article
262
Re, V.; Manghisoni, M.; Ratti, Lodovico; Speziali, Valeria; Traversi, G.
1 Contributo su Rivista::1.1 Articolo in rivista
none
1.1 Articolo in rivista
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11571/31897
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