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Total Ionizing Dose effects in 130-nm commercial CMOS technologies for HEP experiments

RATTI, LODOVICO;
2007-01-01
2007
The Electrical and Electronics Engineering category covers resources concerned with applications of electricity, generally those involving current flow through conductors, as in motors and generators. This category also covers the examination of the conduction of electricity through gases or a vacuum as well as through semiconducting materials. Topics include image and signal processing, electromagnetics, electronic components and materials, microwave technology, and microelectronics.
sì
WOS:000251928000012
2-s2.0-36048975172
Esperti anonimi
Inglese
Internazionale
STAMPA
582
3
750
754
5
ionizing radiation damage; CMOS processes; rad-hard design; low-noise analog front-end
no
9
info:eu-repo/semantics/article
262
Gonella, L.; Faccio, F.; Silvestri, M.; Gerardin, S.; Pantano, D.; Re, V.; Manghisoni, M.; Ratti, Lodovico; Ranieri, A.
1 Contributo su Rivista::1.1 Articolo in rivista
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1.1 Articolo in rivista
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11571/31898
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