Abstract— We analyze the random errors occurring in interferometric measurements because of the speckle pattern regime, when the remote target is a diffusing surface. First, we review the statistical properties of speckle and discuss amplitude fading affecting the self-mixing interferometer (SMI) signal and methods to alleviate it. Second, we derive intra-speckle phase errors using the bivariate conditional probability, and find that the noise-equivalent-displacement (NED) for small displacement \delta is proportional to the ratio of \delta to speckle longitudinal size sl. Last, we extend the analysis to inter-speckle displacements (\delta >sl) and, after deriving speckle systematic and random errors, show that operation up to meters on a diffusing surface target is possible with a small (≈\lambda error. Results are mainly focussed on SMI, yet they have general validity for any configuration of interferometry.

Speckle Pattern Errors in Self-Mixing Interferometry

DONATI, SILVANO;MARTINI, GIUSEPPE;
2013-01-01

Abstract

Abstract— We analyze the random errors occurring in interferometric measurements because of the speckle pattern regime, when the remote target is a diffusing surface. First, we review the statistical properties of speckle and discuss amplitude fading affecting the self-mixing interferometer (SMI) signal and methods to alleviate it. Second, we derive intra-speckle phase errors using the bivariate conditional probability, and find that the noise-equivalent-displacement (NED) for small displacement \delta is proportional to the ratio of \delta to speckle longitudinal size sl. Last, we extend the analysis to inter-speckle displacements (\delta >sl) and, after deriving speckle systematic and random errors, show that operation up to meters on a diffusing surface target is possible with a small (≈\lambda error. Results are mainly focussed on SMI, yet they have general validity for any configuration of interferometry.
2013
The Electrical and Electronics Engineering category covers resources concerned with applications of electricity, generally those involving current flow through conductors, as in motors and generators. This category also covers the examination of the conduction of electricity through gases or a vacuum as well as through semiconducting materials. Topics include image and signal processing, electromagnetics, electronic components and materials, microwave technology, and microelectronics.
Esperti anonimi
Inglese
Internazionale
STAMPA
49
9
798
806
9
Interferometry; Speckle Pattern; Vibration and Displacement Measurements; Optical Feedback Lasers
3
info:eu-repo/semantics/article
262
Donati, Silvano; Martini, Giuseppe; Tambosso, Tizianaa
1 Contributo su Rivista::1.1 Articolo in rivista
none
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11571/767030
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