Single-axis, rotational micromirrors actuated by comb finger structures have been designed, in view of their application in reflective scanning picoprojectors for laser beam displacement along two perpendicular directions to obtain a raster scan scheme. A resonant mirror operating at a frequency around 25 kHz, suitable for horizontal scans, as well as a linear mirror, suitable for vertical scan at the typical video refresh rate (60 Hz), have been fabricated by Silicon-on-Insulator technology and are illustrated in this work. We have in particular exploited the potentialities of semiconductor laser self-mixing interferometry, a powerful technique for characterizing the dynamic response of MEMS, for detecting the electro-mechanical response of both kinds of micromirrors. We report the results of the spot optical measurements performed on resonant and linear mirrors aimed at detecting the frequency of the fundamental rotational mode as well as of the in-plane and out-of-plane modes, close in frequency to the fundamental mode. We have experimentally demonstrated that the fabricated devices are suitable for high resolution miniaturized projectors, in terms of frequency response and scanning angle.
Optical detection of the electro-mechanical response of MEMS micromirrors designed for scanning picoprojectors
SILVA, GLORIA;CARPIGNANO, FRANCESCA MARIA CARLA;MERLO, SABINA GIOVANNA
2015-01-01
Abstract
Single-axis, rotational micromirrors actuated by comb finger structures have been designed, in view of their application in reflective scanning picoprojectors for laser beam displacement along two perpendicular directions to obtain a raster scan scheme. A resonant mirror operating at a frequency around 25 kHz, suitable for horizontal scans, as well as a linear mirror, suitable for vertical scan at the typical video refresh rate (60 Hz), have been fabricated by Silicon-on-Insulator technology and are illustrated in this work. We have in particular exploited the potentialities of semiconductor laser self-mixing interferometry, a powerful technique for characterizing the dynamic response of MEMS, for detecting the electro-mechanical response of both kinds of micromirrors. We report the results of the spot optical measurements performed on resonant and linear mirrors aimed at detecting the frequency of the fundamental rotational mode as well as of the in-plane and out-of-plane modes, close in frequency to the fundamental mode. We have experimentally demonstrated that the fabricated devices are suitable for high resolution miniaturized projectors, in terms of frequency response and scanning angle.File | Dimensione | Formato | |
---|---|---|---|
JSTQE2369499 with declaration.pdf
accesso aperto
Tipologia:
Documento in Post-print
Licenza:
Creative commons
Dimensione
1.54 MB
Formato
Adobe PDF
|
1.54 MB | Adobe PDF | Visualizza/Apri |
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.