We extend ptychography CDI to allow for imaging of multiple areas on a sample simultaneously using multiple identical beams. This enables high throughput imaging of large samples without increased data collection or loss in resolution.
Multiple beam ptychography for high throughput data acquisition
Bevis C.;Mancini G. F.Membro del Collaboration Group
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2016-01-01
Abstract
We extend ptychography CDI to allow for imaging of multiple areas on a sample simultaneously using multiple identical beams. This enables high throughput imaging of large samples without increased data collection or loss in resolution.File in questo prodotto:
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