We use reflection-mode ptychography CDI with HHG illumination to image copper nanostructures buried beneath 100nm of aluminum. Our technique yields absolute reflectivity images, allowing non-destructive detection of diffusion at the Al-Cu boundary, confirmed by Auger-Electron-Spectroscopy.

Coherent diffraction imaging of buried nanostructures in a reflection geometry with extreme ultraviolet light

Mancini G. F.
Membro del Collaboration Group
;
Bevis C. S.;
2016-01-01

Abstract

We use reflection-mode ptychography CDI with HHG illumination to image copper nanostructures buried beneath 100nm of aluminum. Our technique yields absolute reflectivity images, allowing non-destructive detection of diffusion at the Al-Cu boundary, confirmed by Auger-Electron-Spectroscopy.
2016
978-1-943580-11-8
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11571/1477833
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