The effect of deuterium irradiation on the optical and strain properties of GaAsN/GaAs heterostructures was investigated by photoreflectance and reflectance techniques. The strain occurring in as-grown and deuterated GaAsN layers is monitored and measured by means of photoreflectance spectroscopy, highlighting the strain inversion after irradiation. By combining static and modulated reflectance results, evidence is given that the deuterium-induced recovery of the GaAs band gap as well as the strain inversion in GaAsN layers are accompanied by a 0.4%– 0.8% reduction of the refractive index in the 1.31 and 1.55 m spectral windows of interest for fiber optic communications.

Photoreflectance and Reflectance investigation of deuterium-irradiated GaAsN

GEDDO, MARIO;CIABATTONI, TIZIANA;GUIZZETTI, GIORGIO;GALLI, MATTEO;PATRINI, MADDALENA;
2007-01-01

Abstract

The effect of deuterium irradiation on the optical and strain properties of GaAsN/GaAs heterostructures was investigated by photoreflectance and reflectance techniques. The strain occurring in as-grown and deuterated GaAsN layers is monitored and measured by means of photoreflectance spectroscopy, highlighting the strain inversion after irradiation. By combining static and modulated reflectance results, evidence is given that the deuterium-induced recovery of the GaAs band gap as well as the strain inversion in GaAsN layers are accompanied by a 0.4%– 0.8% reduction of the refractive index in the 1.31 and 1.55 m spectral windows of interest for fiber optic communications.
2007
The Physics category includes resources of a broad, general nature that contain materials from all areas of physics, The category also includes resources specifically concerned with the following physics sub-fields: mathematical physics, particle and nuclear physics, physics of fluids and plasmas, quantum physics, and theoretical physics.
Sì, ma tipo non specificato
Inglese
Internazionale
STAMPA
90
091907-1
091907-3
These results anticipate a single step process to an in-plane confinement of carriers and photons.
NITRURI DILUITI; FOTORIFLETTANZA; RIFLETTANZA
http://scitation.aip.org/getabs/servlet/GetabsServlet?prog=normal&id=APPLAB000090000009091907000001&idtype=cvips&gifs=yes
13
info:eu-repo/semantics/article
262
Geddo, Mario; Ciabattoni, Tiziana; Guizzetti, Giorgio; Galli, Matteo; Patrini, Maddalena; A., Polimeni; R., Trotta; M., Capizzi; G., Bais; M., Piccin;...espandi
1 Contributo su Rivista::1.1 Articolo in rivista
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11571/32489
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