The dispersion of photonic modes in Silicon-on-Insulator patterned waveguides containing line defects is fully investigated both above and below the light-line. Quasi-guided (radiative) as well as truly guided modes are probed by means of angle- and polarization-resolved micro-reflectance and attenuated total reflectance measurements. The presence of a supercell repetition leads to the simultaneous excitation of defect and bulk modes, which are folded in a reduced Brillouin zone. The measured disperion is in very good agreement with full 3D calculations based on expansion on the waveguide modes, indicating that a deep understanding of the propagation properties of patterned silicon-on insulator waveguides is achieved.
Measurement of radiative and guided modes in silicon-on-insulator photonic crystal slabs
GALLI, MATTEO;BAJONI, DANIELE;PATRINI, MADDALENA;GUIZZETTI, GIORGIO;GERACE, DARIO;ANDREANI, LUCIO;
2004-01-01
Abstract
The dispersion of photonic modes in Silicon-on-Insulator patterned waveguides containing line defects is fully investigated both above and below the light-line. Quasi-guided (radiative) as well as truly guided modes are probed by means of angle- and polarization-resolved micro-reflectance and attenuated total reflectance measurements. The presence of a supercell repetition leads to the simultaneous excitation of defect and bulk modes, which are folded in a reduced Brillouin zone. The measured disperion is in very good agreement with full 3D calculations based on expansion on the waveguide modes, indicating that a deep understanding of the propagation properties of patterned silicon-on insulator waveguides is achieved.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
