SCHIRRU, ANDREA
SCHIRRU, ANDREA
DIPARTIMENTO DI INGEGNERIA INDUSTRIALE E DELL'INFORMAZIONE
A hidden-Gamma model-based filtering and prediction approach for monotonic health factors in manufacturing
2018-01-01 Susto G., A; Schirru, Andrea; Pampuri, Simone; S., and Beghi; Nicolao, De
An information-theory and Virtual Metrology-based approach to Run-to-Run semiconductor manufacturing control
2012-01-01 G., Susto; Schirru, Andrea; Pampuri, Simone; DE NICOLAO, Giuseppe; A., Beghi
Multi-step virtual metrology for semiconductor manufacturing: A multilevel and regularization methods-based approach
2015-01-01 Susto, G.; Pampuri, Simone; Schirru, Andrea; Beghi, A.; DE NICOLAO, Giuseppe
Multicenter Study on Sleep and Circadian Alterations as Objective Markers of Mild Cognitive Impairment and Alzheimer's Disease Reveals Sex Differences
2020-01-01 Guarnieri, B.; Maestri, M.; Cucchiara, F.; Lo Gerfo, A.; Schirru, A.; Arnaldi, D.; Mattioli, P.; Nobili, F.; Lombardi, G.; Cerroni, G.; Bartoli, A.; Manni, R.; Sinforiani, E.; Terzaghi, M.; Arena, M. G.; Silvestri, R.; La Morgia, C.; DI Perri, M. C.; Franzoni, F.; Tognoni, G.; Mancuso, M.; Sorbi, S.; Bonuccelli, U.; Siciliano, G.; Faraguna, U.; Bonanni, E.
Multilevel kernel methods for virtual metrology in semiconductor manufacturing
2011-01-01 Schirru, Andrea; Pampuri, Simone; De Luca, Cristina; DE NICOLAO, Giuseppe
Multilevel Lasso Applied to Virtual Metrology in Semiconductor Manufacturing
2011-01-01 Pampuri, Simone; Schirru, Andrea; Fazio, Giuseppe; DE NICOLAO, Giuseppe
Multilevel Lasso Applied to Virtual Metrology in Semiconductor Manufacturing
2011-01-01 Pampuri, Simone; Schirru, Andrea; G., Fazio; DE NICOLAO, Giuseppe
Multilevel Lasso Applied to Virtual Metrology in Semiconductor Manufacturing
2011-01-01 Pampuri, Simone; Schirru, Andrea; G., Fazio; DE NICOLAO, Giuseppe
Multilevel statistical process control of asynchronous multi-stream processes in semiconductor manufacturing
2010-01-01 Schirru, Andrea; Pampuri, Simone; DE NICOLAO, Giuseppe
Multistep virtual metrology approaches for semiconductor manufacturing processes
2012-01-01 Pampuri, Simone; Schirru, Andrea; G., Susto; C. D., Luca; A., Beghi; DE NICOLAO, Giuseppe
Nonparametric Virtual Sensors for Semiconductor Manufacturing".
2011-01-01 Schirru, Andrea; Pampuri, Simone; De Luca, Cristina; DE NICOLAO, Giuseppe
Particle filtering of hidden Gamma processes for robust Predictive Maintenance in semiconductor manufacturing
2010-01-01 Schirru, Andrea; Pampuri, Simone; DE NICOLAO, Giuseppe
Proportional Hazard Model with L1 Penalization applied to Predictive Maintenance in Semiconductor Manufacturing
2011-01-01 Pampuri, Simone; Schirru, Andrea; C., De Luca; DE NICOLAO, Giuseppe
Proportional Hazard Model with L1 Penalization applied to Predictive Maintenance in Semiconductor Manufacturing
2011-01-01 Pampuri, Simone; Schirru, Andrea; C., De Luca; DE NICOLAO, Giuseppe
Proportional Hazard Model with L1 Penalization applied to Predictive Maintenance in Semiconductor Manufacturing
2011-01-01 Pampuri, Simone; Schirru, Andrea; De Luca, Cristina; DE NICOLAO, Giuseppe
Virtual sensors for semiconductor manufacturing: A nonparametric approach - Exploiting information theoretic learning and Kernel machines
2013-01-01 Schirru, Andrea; Pampuri, Simone; C., De Luca; DE NICOLAO, Giuseppe
| Titolo | Data di pubblicazione | Autore(i) | File |
|---|---|---|---|
| A hidden-Gamma model-based filtering and prediction approach for monotonic health factors in manufacturing | 1-gen-2018 | Susto G., A; Schirru, Andrea; Pampuri, Simone; S., and Beghi; Nicolao, De | |
| An information-theory and Virtual Metrology-based approach to Run-to-Run semiconductor manufacturing control | 1-gen-2012 | G., Susto; Schirru, Andrea; Pampuri, Simone; DE NICOLAO, Giuseppe; A., Beghi | |
| Multi-step virtual metrology for semiconductor manufacturing: A multilevel and regularization methods-based approach | 1-gen-2015 | Susto, G.; Pampuri, Simone; Schirru, Andrea; Beghi, A.; DE NICOLAO, Giuseppe | |
| Multicenter Study on Sleep and Circadian Alterations as Objective Markers of Mild Cognitive Impairment and Alzheimer's Disease Reveals Sex Differences | 1-gen-2020 | Guarnieri, B.; Maestri, M.; Cucchiara, F.; Lo Gerfo, A.; Schirru, A.; Arnaldi, D.; Mattioli, P.; Nobili, F.; Lombardi, G.; Cerroni, G.; Bartoli, A.; Manni, R.; Sinforiani, E.; Terzaghi, M.; Arena, M. G.; Silvestri, R.; La Morgia, C.; DI Perri, M. C.; Franzoni, F.; Tognoni, G.; Mancuso, M.; Sorbi, S.; Bonuccelli, U.; Siciliano, G.; Faraguna, U.; Bonanni, E. | |
| Multilevel kernel methods for virtual metrology in semiconductor manufacturing | 1-gen-2011 | Schirru, Andrea; Pampuri, Simone; De Luca, Cristina; DE NICOLAO, Giuseppe | |
| Multilevel Lasso Applied to Virtual Metrology in Semiconductor Manufacturing | 1-gen-2011 | Pampuri, Simone; Schirru, Andrea; Fazio, Giuseppe; DE NICOLAO, Giuseppe | |
| Multilevel Lasso Applied to Virtual Metrology in Semiconductor Manufacturing | 1-gen-2011 | Pampuri, Simone; Schirru, Andrea; G., Fazio; DE NICOLAO, Giuseppe | |
| Multilevel Lasso Applied to Virtual Metrology in Semiconductor Manufacturing | 1-gen-2011 | Pampuri, Simone; Schirru, Andrea; G., Fazio; DE NICOLAO, Giuseppe | |
| Multilevel statistical process control of asynchronous multi-stream processes in semiconductor manufacturing | 1-gen-2010 | Schirru, Andrea; Pampuri, Simone; DE NICOLAO, Giuseppe | |
| Multistep virtual metrology approaches for semiconductor manufacturing processes | 1-gen-2012 | Pampuri, Simone; Schirru, Andrea; G., Susto; C. D., Luca; A., Beghi; DE NICOLAO, Giuseppe | |
| Nonparametric Virtual Sensors for Semiconductor Manufacturing". | 1-gen-2011 | Schirru, Andrea; Pampuri, Simone; De Luca, Cristina; DE NICOLAO, Giuseppe | |
| Particle filtering of hidden Gamma processes for robust Predictive Maintenance in semiconductor manufacturing | 1-gen-2010 | Schirru, Andrea; Pampuri, Simone; DE NICOLAO, Giuseppe | |
| Proportional Hazard Model with L1 Penalization applied to Predictive Maintenance in Semiconductor Manufacturing | 1-gen-2011 | Pampuri, Simone; Schirru, Andrea; C., De Luca; DE NICOLAO, Giuseppe | |
| Proportional Hazard Model with L1 Penalization applied to Predictive Maintenance in Semiconductor Manufacturing | 1-gen-2011 | Pampuri, Simone; Schirru, Andrea; C., De Luca; DE NICOLAO, Giuseppe | |
| Proportional Hazard Model with L1 Penalization applied to Predictive Maintenance in Semiconductor Manufacturing | 1-gen-2011 | Pampuri, Simone; Schirru, Andrea; De Luca, Cristina; DE NICOLAO, Giuseppe | |
| Virtual sensors for semiconductor manufacturing: A nonparametric approach - Exploiting information theoretic learning and Kernel machines | 1-gen-2013 | Schirru, Andrea; Pampuri, Simone; C., De Luca; DE NICOLAO, Giuseppe |