PAMPURI, SIMONE
PAMPURI, SIMONE
DIPARTIMENTO DI INGEGNERIA INDUSTRIALE E DELL'INFORMAZIONE
A hidden-Gamma model-based filtering and prediction approach for monotonic health factors in manufacturing
2018-01-01 Susto G., A; Schirru, Andrea; Pampuri, Simone; S., and Beghi; Nicolao, De
An information-theory and Virtual Metrology-based approach to Run-to-Run semiconductor manufacturing control
2012-01-01 G., Susto; Schirru, Andrea; Pampuri, Simone; DE NICOLAO, Giuseppe; A., Beghi
Multi-step virtual metrology for semiconductor manufacturing: A multilevel and regularization methods-based approach
2015-01-01 Susto, G.; Pampuri, Simone; Schirru, Andrea; Beghi, A.; DE NICOLAO, Giuseppe
Multilevel kernel methods for virtual metrology in semiconductor manufacturing
2011-01-01 Schirru, Andrea; Pampuri, Simone; De Luca, Cristina; DE NICOLAO, Giuseppe
Multilevel Lasso Applied to Virtual Metrology in Semiconductor Manufacturing
2011-01-01 Pampuri, Simone; Schirru, Andrea; G., Fazio; DE NICOLAO, Giuseppe
Multilevel Lasso Applied to Virtual Metrology in Semiconductor Manufacturing
2011-01-01 Pampuri, Simone; Schirru, Andrea; Fazio, Giuseppe; DE NICOLAO, Giuseppe
Multilevel Lasso Applied to Virtual Metrology in Semiconductor Manufacturing
2011-01-01 Pampuri, Simone; Schirru, Andrea; G., Fazio; DE NICOLAO, Giuseppe
Multilevel statistical process control of asynchronous multi-stream processes in semiconductor manufacturing
2010-01-01 Schirru, Andrea; Pampuri, Simone; DE NICOLAO, Giuseppe
Multistep virtual metrology approaches for semiconductor manufacturing processes
2012-01-01 Pampuri, Simone; Schirru, Andrea; G., Susto; C. D., Luca; A., Beghi; DE NICOLAO, Giuseppe
Nonparametric Virtual Sensors for Semiconductor Manufacturing".
2011-01-01 Schirru, Andrea; Pampuri, Simone; De Luca, Cristina; DE NICOLAO, Giuseppe
Particle filtering of hidden Gamma processes for robust Predictive Maintenance in semiconductor manufacturing
2010-01-01 Schirru, Andrea; Pampuri, Simone; DE NICOLAO, Giuseppe
Proportional Hazard Model with L1 Penalization applied to Predictive Maintenance in Semiconductor Manufacturing
2011-01-01 Pampuri, Simone; Schirru, Andrea; C., De Luca; DE NICOLAO, Giuseppe
Proportional Hazard Model with L1 Penalization applied to Predictive Maintenance in Semiconductor Manufacturing
2011-01-01 Pampuri, Simone; Schirru, Andrea; C., De Luca; DE NICOLAO, Giuseppe
Proportional Hazard Model with L1 Penalization applied to Predictive Maintenance in Semiconductor Manufacturing
2011-01-01 Pampuri, Simone; Schirru, Andrea; De Luca, Cristina; DE NICOLAO, Giuseppe
Virtual sensors for semiconductor manufacturing: A nonparametric approach - Exploiting information theoretic learning and Kernel machines
2013-01-01 Schirru, Andrea; Pampuri, Simone; C., De Luca; DE NICOLAO, Giuseppe