TORILLA, GIANMARCO
 Distribuzione geografica
Continente #
NA - Nord America 196
EU - Europa 187
AS - Asia 173
SA - Sud America 25
AF - Africa 3
Totale 584
Nazione #
US - Stati Uniti d'America 189
IT - Italia 80
CN - Cina 59
SG - Singapore 52
HK - Hong Kong 31
RU - Federazione Russa 31
BR - Brasile 24
IE - Irlanda 17
DE - Germania 13
VN - Vietnam 12
IN - India 8
FR - Francia 6
GB - Regno Unito 6
AL - Albania 5
CH - Svizzera 5
MX - Messico 5
AT - Austria 4
CZ - Repubblica Ceca 4
FI - Finlandia 4
SE - Svezia 4
NL - Olanda 3
BE - Belgio 2
JP - Giappone 2
TW - Taiwan 2
ZA - Sudafrica 2
AZ - Azerbaigian 1
CA - Canada 1
CL - Cile 1
GR - Grecia 1
IQ - Iraq 1
IR - Iran 1
JM - Giamaica 1
KR - Corea 1
KZ - Kazakistan 1
MA - Marocco 1
PH - Filippine 1
PL - Polonia 1
PT - Portogallo 1
UZ - Uzbekistan 1
Totale 584
Città #
Chandler 30
Hong Kong 30
Singapore 28
Beijing 21
Pavia 19
Dublin 17
Duncan 17
Milan 15
Dallas 14
Ashburn 12
Los Angeles 10
Shanghai 10
Boardman 9
Redondo Beach 9
Moscow 8
Reggio Emilia 5
Tirana 5
Boston 4
Chennai 4
Helsinki 4
Mascalucia 4
The Dalles 4
České Budějovice 4
Falkenstein 3
Geneva 3
Genoa 3
Ho Chi Minh City 3
Lawrence 3
Medford 3
Monsummano Terme 3
Monza 3
Princeton 3
Amsterdam 2
Buffalo 2
Chengdu 2
Chicago 2
Düsseldorf 2
Hamburg 2
Hanoi 2
Houston 2
Hyderabad 2
La Louvière 2
Lausanne 2
Lauterbourg 2
Mexico City 2
New Delhi 2
New York 2
Padova 2
Portsmouth 2
Rho 2
Rome 2
Shenzhen 2
Stockholm 2
São Paulo 2
Taipei 2
Taiyuan 2
Tokyo 2
Urgnano 2
Wilmington 2
Allentown 1
Almaty 1
Ann Arbor 1
Apodaca 1
Athens 1
Azambuja 1
Baghdad 1
Biên Hòa 1
Borås 1
Brasília 1
Brooklyn 1
Cabo Frio 1
Cambé 1
Canoas 1
Cape Town 1
Casablanca 1
Casal di Principe 1
Catania 1
Chongqing 1
Chuzhou 1
Columbus 1
Como 1
Corumbaíba 1
Curitiba 1
Da Nang 1
Denver 1
Florence 1
Francisco Morato 1
Frankfurt am Main 1
Ganja 1
Goiânia 1
Guarulhos 1
Haiphong 1
Honolulu 1
Huizhou 1
Incheon 1
Ipatinga 1
Itu 1
Johannesburg 1
Kensington 1
Kingston 1
Totale 405
Nome #
A test platform for CMOS SPADs and digital SiPMs in a 110 nm technology 87
DCR Performance in Neutron-Irradiated CMOS SPADs from 150- To 180-nm Technologies 84
APiX, a two-tier avalanche pixel sensor for digital charged particle detection 81
Layered CMOS SPADs for Low Noise Detection of Charged Particles 69
Characterization of a Fast Neutron Irradiation Facility Using a Stilbene Scintillation Detector 63
Online Dark Count Rate Measurements in 150 nm CMOS SPADs Exposed to Low Neutron Fluxes 46
A Wireless, Battery-Powered Probe Based on a Dual-Tier CMOS SPAD Array for Charged Particle Sensing 45
Cross-talk and RTS Noise Characterization of 1- and 2-tier CMOS SPADs in a 150 nm Process 38
DCR and crosstalk characterization of a bi-layered 24 × 72 CMOS SPAD array for charged particle detection 37
Radiation effects and underlying damage mechanisms in the dark count rate of CMOS SPADs 25
Bulk Damage Effects in Neutron Irradiated Single- and Dual-Layer 150-nm CMOS SPADs 15
Experimental results of the pFREYA16 ASIC for x-ray ptychography in continuous wave light sources 9
Totale 599
Categoria #
all - tutte 2.755
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 2.755


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/202117 0 0 0 0 0 0 3 6 2 0 0 6
2021/202240 0 0 4 0 1 0 17 6 0 1 3 8
2022/202363 5 7 1 9 4 6 0 5 23 0 2 1
2023/202465 3 4 3 2 4 3 2 3 1 1 26 13
2024/2025222 16 9 14 12 20 5 21 3 58 17 18 29
2025/2026185 30 24 22 43 65 1 0 0 0 0 0 0
Totale 599