Sfoglia per Autore
Infrared study of iron impurities in polycrystalline solar grade silicon
1988-01-01 Alessandro, Borghesi; Geddo, Mario; Angiolino, Stella
A new computer-aided apparatus for simultaneous measurements of water uptake and swelling force in tablets
1988-01-01 Caramella, CARLA MARCELLA; Ferrari, Franca; A., Gazzaniga; Conte, Ubaldo; A., La Manna; Geddo, Mario
Infrared investigation of the presence of Fe in B-doped polycrystalline silicon
1988-01-01 A., Borghesi; Geddo, Mario; A., Stella; Chen Chen, Jia
Water uptake to fast disintegrating tablets and Weibull function
1988-01-01 Ferrari, Franca; Geddo, Mario; A., Gazzaniga; Caramella, CARLA MARCELLA; Conte, Ubaldo
Infrared microcharacterization of grain boundaries in polycrystalline silicon
1989-01-01 A., Borghesi; Geddo, Mario; Guizzetti, Giorgio; S., Pizzini; D., Narducci; A., Sandrinelli; G., Zachmann
Quantitative IR spectroscopy of interstitial Oxygen in heavily doped Silicon
1989-01-01 A., Borghesi; Geddo, Mario; Guizzetti, Giorgio; P., Geranzani
Characterization of impurities in silicon by IR spectroscopy
1989-01-01 A., Borghesi; Geddo, Mario; Guizzetti, Giorgio; A., Stella; P., Geranzani
DIagnostica ottica dei materiali: alcuni esempi
1989-01-01 A., Borghesi; Geddo, Mario; Guizzetti, Giorgio; L., Nosenzo; A., Stella
Optical characterization of semiconductor, interfaces and heterostructures
1989-01-01 A., Borghesi; Geddo, Mario; Guizzetti, Giorgio; A., Stella
Infrared angular spectroscopy characterization of epitaxial layers of n-type silicon grown on N+ or P+ substrates
1989-01-01 Geddo, Mario; D., Maghini; A., Stella
Optical determination of oxygen outdiffusion in epitaxial silicon grown on n-type Czochralski substrates
1990-01-01 Geddo, Mario; B., Pivac; A., Borghesi; A., Stella; M., Pedrotti
Infrared study of Fe-B-pair behavior in iron-implanted Czochralski silicon
1990-01-01 Geddo, Mario; B., Pivac; A., Borghesi; A., Stella; S. U., Campisano; E., Rimini
Interstitial oxygen determination in heavily doped silicon
1990-01-01 A., Borghesi; Geddo, Mario; Guizzetti, Giorgio; P., Geranzani
Oxygen and iron redistribution upon thermal treatment in iron implanted silicon
1990-01-01 B., Pivac; A., Borghesi; L., Ottolini; Geddo, Mario; A., Piaggi; A., Stella
Thermal redistribution of iron implanted in Czochralski silicon
1990-01-01 B., Pivac; A., Borghesi; Geddo, Mario; A., Stella; L., Ottolini
Quantitative determination of high-temperature oxygen microprecipitates in Czochralski silicon by micro-Fourier transform infrared spectroscopy
1991-01-01 A., Borghesi; Geddo, Mario; B., Pivac; A., Sassella; A., Stella
Direct evidence of oxygen precipitates in epitaxial silicon obtained by micro-Fourier transform infrared spectroscopy
1991-01-01 A., Borghesi; Geddo, Mario; B., Pivac; A., Stella; P., Lupano
Oxygen behaviour in Czochralski silicon substrates and epitaxial layers
1991-01-01 A., Stella; A., Borghesi; Geddo, Mario; B., Pivac; A., Sassella
Impurities in Silicon Crystals and Silicon Epitaxial Films: Recent Advances
1991-01-01 B., Pivac; A., Borghesi; Geddo, Mario; A., Stella
Interstitial oxygen determination near epitaxial silicon and Czochralski silicon interface
1991-01-01 Geddo, Mario; B., Pivac; A., Borghesi; A., Stella; M., Pedrotti
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