SCHIRRU, ANDREA
 Distribuzione geografica
Continente #
NA - Nord America 464
EU - Europa 309
AS - Asia 184
SA - Sud America 2
Totale 959
Nazione #
US - Stati Uniti d'America 463
CN - Cina 182
IE - Irlanda 118
UA - Ucraina 52
FI - Finlandia 43
DE - Germania 34
SE - Svezia 31
IT - Italia 17
GB - Regno Unito 10
BR - Brasile 2
FR - Francia 2
CA - Canada 1
CZ - Repubblica Ceca 1
HK - Hong Kong 1
JP - Giappone 1
NL - Olanda 1
Totale 959
Città #
Chandler 160
Dublin 118
Jacksonville 74
Nanjing 60
Ashburn 24
Hebei 23
Wilmington 20
Medford 16
Princeton 16
Shenyang 16
Changsha 15
Helsinki 15
Lawrence 15
Nanchang 13
Shanghai 13
Tianjin 12
Hangzhou 11
Jiaxing 11
Seattle 11
Boardman 8
Piscataway 7
Somma Lombardo 6
Woodbridge 6
Ann Arbor 5
Pavia 5
Dearborn 2
Fairfield 2
Milan 2
Ningbo 2
Redmond 2
Barletta 1
Des Moines 1
Garching 1
Genova 1
Hagen 1
Houston 1
Kunming 1
Los Angeles 1
Olomouc 1
Orange 1
Taizhou 1
Tokyo 1
Toronto 1
Verona 1
Washington 1
Xian 1
Totale 706
Nome #
Multilevel Lasso Applied to Virtual Metrology in Semiconductor Manufacturing 80
Multilevel Lasso Applied to Virtual Metrology in Semiconductor Manufacturing 75
Multi-step virtual metrology for semiconductor manufacturing: A multilevel and regularization methods-based approach 73
An information-theory and Virtual Metrology-based approach to Run-to-Run semiconductor manufacturing control 72
Multilevel statistical process control of asynchronous multi-stream processes in semiconductor manufacturing 71
Particle filtering of hidden Gamma processes for robust Predictive Maintenance in semiconductor manufacturing 70
A hidden-Gamma model-based filtering and prediction approach for monotonic health factors in manufacturing 60
Multilevel kernel methods for virtual metrology in semiconductor manufacturing 59
Multilevel Lasso Applied to Virtual Metrology in Semiconductor Manufacturing 57
Proportional Hazard Model with L1 Penalization applied to Predictive Maintenance in Semiconductor Manufacturing 54
Proportional Hazard Model with L1 Penalization applied to Predictive Maintenance in Semiconductor Manufacturing 53
Nonparametric Virtual Sensors for Semiconductor Manufacturing". 52
Proportional Hazard Model with L1 Penalization applied to Predictive Maintenance in Semiconductor Manufacturing 51
Multistep virtual metrology approaches for semiconductor manufacturing processes 49
Virtual sensors for semiconductor manufacturing: A nonparametric approach - Exploiting information theoretic learning and Kernel machines 48
Multicenter Study on Sleep and Circadian Alterations as Objective Markers of Mild Cognitive Impairment and Alzheimer's Disease Reveals Sex Differences 43
Totale 967
Categoria #
all - tutte 3.166
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 3.166


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2019/2020209 61 98 0 9 0 14 0 13 0 14 0 0
2020/2021121 18 9 5 9 0 14 1 17 5 21 15 7
2021/202275 0 0 0 1 0 0 2 3 4 1 10 54
2022/2023342 26 42 3 42 30 36 1 16 139 0 5 2
2023/2024115 6 30 1 8 6 15 0 17 0 2 16 14
Totale 967