PAMPURI, SIMONE
 Distribuzione geografica
Continente #
NA - Nord America 457
EU - Europa 306
AS - Asia 215
SA - Sud America 12
Totale 990
Nazione #
US - Stati Uniti d'America 457
CN - Cina 183
IE - Irlanda 110
UA - Ucraina 52
FI - Finlandia 48
DE - Germania 33
SE - Svezia 31
SG - Singapore 29
IT - Italia 16
BR - Brasile 11
GB - Regno Unito 10
FR - Francia 2
RU - Federazione Russa 2
AR - Argentina 1
CZ - Repubblica Ceca 1
HK - Hong Kong 1
IQ - Iraq 1
LK - Sri Lanka 1
NL - Olanda 1
Totale 990
Città #
Chandler 147
Dublin 110
Jacksonville 74
Nanjing 60
Ashburn 24
Boardman 23
Hebei 23
Helsinki 20
Wilmington 19
Shenyang 16
Changsha 15
Medford 15
Princeton 15
Lawrence 14
Nanchang 13
Singapore 13
Shanghai 12
Tianjin 12
Hangzhou 11
Jiaxing 11
Seattle 10
Piscataway 7
Somma Lombardo 6
Woodbridge 6
Ann Arbor 5
Pavia 5
Chicago 2
Dallas 2
Dearborn 2
Fairfield 2
Milan 2
Ningbo 2
Redmond 2
Avellaneda 1
Barletta 1
Des Moines 1
Duhok 1
Fortaleza 1
Garching 1
Genova 1
Guarujá 1
Hagen 1
Houston 1
Jinan 1
Kandy 1
Kunming 1
Los Angeles 1
Moscow 1
Muritiba 1
Nizhny Tagil 1
Nova Serrana 1
Olhos d'Água 1
Olomouc 1
Orange 1
São José dos Campos 1
São Ludgero 1
Taizhou 1
Tupã 1
Varginha 1
Verona 1
Washington 1
Xian 1
Totale 729
Nome #
Multilevel Lasso Applied to Virtual Metrology in Semiconductor Manufacturing 82
Multi-step virtual metrology for semiconductor manufacturing: A multilevel and regularization methods-based approach 77
Multilevel Lasso Applied to Virtual Metrology in Semiconductor Manufacturing 77
Multistep virtual metrology approaches for semiconductor manufacturing processes 76
Multilevel statistical process control of asynchronous multi-stream processes in semiconductor manufacturing 76
An information-theory and Virtual Metrology-based approach to Run-to-Run semiconductor manufacturing control 75
Particle filtering of hidden Gamma processes for robust Predictive Maintenance in semiconductor manufacturing 73
A hidden-Gamma model-based filtering and prediction approach for monotonic health factors in manufacturing 64
Multilevel Lasso Applied to Virtual Metrology in Semiconductor Manufacturing 63
Multilevel kernel methods for virtual metrology in semiconductor manufacturing 62
Proportional Hazard Model with L1 Penalization applied to Predictive Maintenance in Semiconductor Manufacturing 57
Proportional Hazard Model with L1 Penalization applied to Predictive Maintenance in Semiconductor Manufacturing 56
Nonparametric Virtual Sensors for Semiconductor Manufacturing". 55
Proportional Hazard Model with L1 Penalization applied to Predictive Maintenance in Semiconductor Manufacturing 53
Virtual sensors for semiconductor manufacturing: A nonparametric approach - Exploiting information theoretic learning and Kernel machines 51
Totale 997
Categoria #
all - tutte 3.646
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 3.646


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2019/202041 0 0 0 0 0 14 0 13 0 14 0 0
2020/2021120 18 9 5 9 0 14 0 17 5 21 15 7
2021/202268 0 0 0 0 0 0 2 3 3 1 10 49
2022/2023314 23 36 2 40 29 34 1 15 127 0 5 2
2023/2024108 6 26 1 8 6 15 0 16 0 2 15 13
2024/202573 7 17 0 20 17 12 0 0 0 0 0 0
Totale 997