PAMPURI, SIMONE
 Distribuzione geografica
Continente #
NA - Nord America 435
EU - Europa 298
AS - Asia 182
SA - Sud America 2
Totale 917
Nazione #
US - Stati Uniti d'America 435
CN - Cina 181
IE - Irlanda 110
UA - Ucraina 52
FI - Finlandia 42
DE - Germania 33
SE - Svezia 31
IT - Italia 16
GB - Regno Unito 10
BR - Brasile 2
FR - Francia 2
CZ - Repubblica Ceca 1
HK - Hong Kong 1
NL - Olanda 1
Totale 917
Città #
Chandler 147
Dublin 110
Jacksonville 74
Nanjing 60
Ashburn 24
Hebei 23
Wilmington 19
Shenyang 16
Changsha 15
Medford 15
Princeton 15
Helsinki 14
Lawrence 14
Nanchang 13
Shanghai 12
Tianjin 12
Hangzhou 11
Jiaxing 11
Seattle 10
Boardman 8
Piscataway 7
Somma Lombardo 6
Woodbridge 6
Ann Arbor 5
Pavia 5
Dearborn 2
Fairfield 2
Milan 2
Ningbo 2
Redmond 2
Barletta 1
Des Moines 1
Garching 1
Genova 1
Hagen 1
Houston 1
Kunming 1
Los Angeles 1
Olomouc 1
Orange 1
Taizhou 1
Verona 1
Washington 1
Xian 1
Totale 676
Nome #
Multilevel Lasso Applied to Virtual Metrology in Semiconductor Manufacturing 80
Multilevel Lasso Applied to Virtual Metrology in Semiconductor Manufacturing 75
Multi-step virtual metrology for semiconductor manufacturing: A multilevel and regularization methods-based approach 73
An information-theory and Virtual Metrology-based approach to Run-to-Run semiconductor manufacturing control 72
Multilevel statistical process control of asynchronous multi-stream processes in semiconductor manufacturing 71
Particle filtering of hidden Gamma processes for robust Predictive Maintenance in semiconductor manufacturing 70
A hidden-Gamma model-based filtering and prediction approach for monotonic health factors in manufacturing 60
Multilevel kernel methods for virtual metrology in semiconductor manufacturing 59
Multilevel Lasso Applied to Virtual Metrology in Semiconductor Manufacturing 57
Proportional Hazard Model with L1 Penalization applied to Predictive Maintenance in Semiconductor Manufacturing 54
Proportional Hazard Model with L1 Penalization applied to Predictive Maintenance in Semiconductor Manufacturing 53
Nonparametric Virtual Sensors for Semiconductor Manufacturing". 52
Proportional Hazard Model with L1 Penalization applied to Predictive Maintenance in Semiconductor Manufacturing 51
Multistep virtual metrology approaches for semiconductor manufacturing processes 49
Virtual sensors for semiconductor manufacturing: A nonparametric approach - Exploiting information theoretic learning and Kernel machines 48
Totale 924
Categoria #
all - tutte 2.967
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 2.967


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2019/2020209 61 98 0 9 0 14 0 13 0 14 0 0
2020/2021120 18 9 5 9 0 14 0 17 5 21 15 7
2021/202268 0 0 0 0 0 0 2 3 3 1 10 49
2022/2023314 23 36 2 40 29 34 1 15 127 0 5 2
2023/2024108 6 26 1 8 6 15 0 16 0 2 15 13
Totale 924